Statistics
Publications
2
Citations
27
H-Index
2
Active since
1996
Affiliations
Rockwell Automation (United States)(Current)
L. Chung is an author at Rockwell Automation (United States) specializing in electrical engineering, engineering, and materials science.
Publications per year
1996–2003
2
2
Gate oxide thickness dependence of RIE-induced damages on n-channel MOSFET reliability
Atul Joshi, L. Chung, B. Min et al. · 1996 · 17 citations
1–2 of 2