Chung Len Lee

The characteristics of polysilicon oxide grown in pure N/sub 2/O

Chao‐Sung Lai, Tan Fu Lei, Chung Len Lee · IEEE Transactions on Electron Devices · 1996 · 25 citations

Engineering, Electrical Engineering, Materials Science +17

The effects of H/sub 2/-O/sub 2/-plasma treatment on the characteristics of polysilicon thin-film transistors

Horng Nan Chern, Chung Len Lee, Tan Fu Lei · IEEE Transactions on Electron Devices · 1993 · 24 citations

Engineering, Electrical Engineering, Materials Science +17

Nitridation of the stacked poly-Si gate to suppress the boron penetration in pMOS

Yung Hao Lin, Chao‐Sung Lai, Chung Len Lee et al. · IEEE Electron Device Letters · 1995 · 13 citations

Engineering, Electrical Engineering, Materials Science +16

Maximization of power dissipation under random excitation for burn-in testing

Kuo Chan Huang, Chung Len Lee, J.E. Chen · 2002 · 12 citations

Engineering, Computer Engineering, Electrical Engineering +17

Monitoring trapped charge generation for gate oxide under stress [MOS capacitors]

Yung Hao Lin, Chung Len Lee, Tan Fu Lei · IEEE Transactions on Electron Devices · 1997 · 11 citations

Engineering, Electrical Engineering, Materials Science +16