Jonathan A. Kerner

Publications

192

Citations

H-Index

1989

Active since

Affiliations

National Institute of Standards and Technology(Current)

Stanford Synchrotron Radiation Lightsource

Detector Technology (United States)

Stanford University

Jonathan A. Kerner is an author at National Institute of Standards and Technology specializing in synchrotron radiation, engineering, and applied physics.

Top concepts

EngineeringSynchrotron RadiationApplied PhysicsPhysicsPhotonicsInstrumentationOptoelectronicsMicroelectronicsX-ray SpectroscopyElectrical Engineering

Publications per year

1989–2000

Publications

Stability and quantum efficiency performance of silicon photodiode detectors in the far ultraviolet

L. R. Canfield, Jonathan A. Kerner, R. Korde · Applied Optics · 1989 · 102 citations

Application of synchrotron radiation to TXRF analysis of metal contamination on silicon wafer surfaces

P. Pianetta, Katharina Baur, Anoop Pratap Singh et al. · Thin Solid Films · 2000 · 40 citations

Electrical Engineering, Synchrotron Radiation, Engineering +13

Aluminum impurities in silicon: Investigation of x-ray Raman scattering in total reflection x-ray fluorescence spectroscopy

Katharina Baur, Jonathan A. Kerner, S. Brennan et al. · Journal of Applied Physics · 2000 · 23 citations · Full text

Aluminium Nitride, Optical Materials, X-ray Spectroscopy +17

A transmission grating beamline monochromator for the VUV synchrotron light source at NSLS

T. A. Callcott, C. H. ZHANG, K. L. Tsang et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1989 · 15 citations

Beamline Monochromator, Photonics, Engineering +3

Silicon photodiodes optimized for the EUV and soft x-ray regions

L. R. Canfield, Jonathan A. Kerner, R. Korde · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1990 · 12 citations

X-ray Spectroscopy, Engineering, Silicon Photodiodes +20

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