Michael C. W. Coln

"Split ADC" architecture for deterministic digital background calibration of a 16-bit 1-MS/s ADC

John McNeill, Michael C. W. Coln, B.J. Larivee · IEEE Journal of Solid-State Circuits · 2005 · 199 citations

Background Calibration Process, Engineering, Measurement +17

All-Digital Background Calibration of a Successive Approximation ADC Using the “Split ADC” Architecture

John McNeill, Ka Yan Chan, Michael C. W. Coln et al. · IEEE Transactions on Circuits and Systems I Regular Papers · 2011 · 121 citations

Engineering, Calibration, Data Converter +12

A 16-bit 16-MS/s SAR ADC With On-Chip Calibration in 55-nm CMOS

Junhua Shen, Akira Shikata, Lalinda D. Fernando et al. · IEEE Journal of Solid-State Circuits · 2018 · 121 citations

55-Nm Cmos, On-chip Calibration, Engineering +11

Digital Background-Calibration Algorithm for “Split ADC” Architecture

John McNeill, Michael C. W. Coln, D. Richard Brown et al. · IEEE Transactions on Circuits and Systems I Regular Papers · 2009 · 52 citations

Sensor Calibration, Engineering, Calibration +12

“Split ADC” Calibration for All-Digital Correction of Time-Interleaved ADC Errors

John McNeill, Christopher David, Michael C. W. Coln et al. · IEEE Transactions on Circuits & Systems II Express Briefs · 2009 · 49 citations

Half-sized Adcs, Engineering, Measurement +14