D. V. Singh

Electrical integrity of state-of-the-art 0.13 μm SOI CMOS devices and circuits transferred for three-dimensional (3D) integrated circuit (IC) fabrication

K.W. Guarini, Anna W. Topol, M. Ieong et al. · 2003 · 134 citations

Engineering, Computer Engineering, Electrical Engineering +17

Transistor scaling with novel materials

M. Ieong, Vijay Narayanan, D. V. Singh et al. · Materials Today · 2006 · 62 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

Frequency Response of Top-Gated Carbon Nanotube Field-Effect Transistors

D. V. Singh, K.A. Jenkins, Joerg Appenzeller et al. · IEEE Transactions on Nanotechnology · 2004 · 52 citations

Engineering, Electrical Engineering, Materials Science +17

Comparison of Si/Si1−−Ge C and Si/Si1−C heterojunctions grown by rapid thermal chemical vapor deposition

Judy L. Hoyt, T. O. Mitchell, K. Rim et al. · Thin Solid Films · 1998 · 31 citations · Full text

Engineering, Materials Engineering, Materials Science +17

Measurement of the conduction band offsets in Si/Si1−x−yGexCy and Si/Si1−yCy heterostructures using metal-oxide-semiconductor capacitors

D. V. Singh, K. Rim, T. O. Mitchell et al. · Journal of Applied Physics · 1999 · 29 citations

Engineering, Materials Engineering, Materials Science +17