James A. Schrock

Failure Analysis of 1200-V/150-A SiC <sc>MOSFET</sc> Under Repetitive Pulsed Overcurrent Conditions

James A. Schrock, Bejoy N. Pushpakaran, Argenis Bilbao et al. · IEEE Transactions on Power Electronics · 2015 · 93 citations

Engineering, Power Electronics, Overcurrent Conditions +16

High-Mobility Stable 1200-V, 150-A 4H-SiC DMOSFET Long-Term Reliability Analysis Under High Current Density Transient Conditions

James A. Schrock, William B. Ray, Kevin Lawson et al. · IEEE Transactions on Power Electronics · 2014 · 43 citations

Electrical Engineering, Engineering, Sic Dmosfets +15

Failure Modes of 15 kV SiC SGTO Thyristors during Repetitive Extreme Pulsed Overcurrent Conditions

James A. Schrock, Emily Hirsch, Shelby Lacouture et al. · IEEE Transactions on Power Electronics · 2016 · 21 citations

Engineering, Power Electronics, Overcurrent Conditions +18

Spatially dispersive nonlinear transmission line experimental performance analysis

James A. Schrock, Brad W. Hoff, David Simon et al. · IEEE Transactions on Dielectrics and Electrical Insulation · 2019 · 15 citations

Electrical Engineering, Higher Permeability, Engineering +12

Analysis of GaN power MOSFET exporsure to pulsed overcurrents

William B. Ray, James A. Schrock, Argenis Bilbao et al. · 2015 · 14 citations

Electrical Engineering, Engineering, Power Device +10