S. H. Misha

Effect of Nitrogen Doping on Variability of TaOx -RRAM for Low-Power 3-Bit MLC Applications

S. H. Misha, Nusrat Tamanna, Jiyong Woo et al. · ECS Solid State Letters · 2015 · 52 citations · Full text

Effects of RESET Current Overshoot and Resistance State on Reliability of RRAM

Jeonghwan Song, Daeseok Lee, Jiyong Woo et al. · IEEE Electron Device Letters · 2014 · 43 citations

Electrical Engineering, Engineering, Hardware Reliability +15

Effects of Ti Buffer Layer on Retention and Electrical Characteristics of Cu-Based Conductive-Bridge Random Access Memory (CBRAM)

Behnoush Attarimashalkoubeh, Amit Prakash, Sangsul Lee et al. · ECS Solid State Letters · 2014 · 33 citations · Full text

Materials Engineering, Materials Science, Electrical Engineering +12

Highly Reliable Resistive Switching Without an Initial Forming Operation by Defect Engineering

Sangheon Lee, Daeseok Lee, Jiyong Woo et al. · IEEE Electron Device Letters · 2013 · 23 citations

Non-volatile Memory, Engineering, Power Electronics +16

Grover’s algorithm in a four-qubit silicon processor above the fault-tolerant threshold

Ian Thorvaldson, D. Poulos, Christian M. Moehle et al. · Nature Nanotechnology · 2025 · 21 citations · Full text