J. Smoliner

Integrating an Ultramicroelectrode in an AFM Cantilever:  Combined Technology for Enhanced Information

Christine Kranz, Gernot Friedbacher, Boris Mizaikoff et al. · Analytical Chemistry · 2001 · 313 citations

Engineering, Microscopy, Mechanical Engineering +23

Calibrated nanoscale capacitance measurements using a scanning microwave microscope

H. Huber, Manuel Moertelmaier, Thomas M. Wallis et al. · Review of Scientific Instruments · 2010 · 143 citations

Momentum conservation in tunneling processes between barrier-separated 2D-electron-gas systems

J. Smoliner, W. Demmerle, G. Berthold et al. · Physical Review Letters · 1989 · 114 citations

Quantum Science, Engineering, Tunneling Microscopy +11

Calibrated nanoscale dopant profiling using a scanning microwave microscope

H. Huber, I. Humer, M. Hochleitner et al. · Journal of Applied Physics · 2012 · 90 citations

Engineering, Microscopy, Integrated Circuits +16

FIB processing of silicon in the nanoscale regime

Alois Lugstein, B. Basnar, J. Smoliner et al. · Applied Physics A · 2003 · 72 citations

Materials Science, Wafer Scale Processing, Engineering +9