Tamer San

Large ferroelectric polarization of TiN/Hf0.5Zr0.5O2/TiN capacitors due to stress-induced crystallization at low thermal budget

Si Joon Kim, Dushyant Narayan, Jae‐Gil Lee et al. · Applied Physics Letters · 2017 · 286 citations

Engineering, Low Thermal Budget, Stress-induced Crystallization +16

Effect of film thickness on the ferroelectric and dielectric properties of low-temperature (400 °C) Hf0.5Zr0.5O2 films

Si Joon Kim, Jaidah Mohan, Jaebeom Lee et al. · Applied Physics Letters · 2018 · 155 citations

Materials Science, Dielectric Properties, Engineering +12

Low-voltage operation and high endurance of 5-nm ferroelectric Hf0.5Zr0.5O2 capacitors

Si Joon Kim, Jaidah Mohan, Harrison Sejoon Kim et al. · Applied Physics Letters · 2018 · 79 citations

Materials Science, Materials Engineering, Electrical Engineering +15

Flash EPROM disturb mechanisms

C. Dunn, Çağlar Kaya, T.G. Lewis et al. · 1994 · 59 citations

Electrical Engineering, Engineering, Nanoelectronics +12

Effect of hydrogen derived from oxygen source on low-temperature ferroelectric TiN/Hf0.5Zr0.5O2/TiN capacitors

Si Joon Kim, Jaidah Mohan, Harrison Sejoon Kim et al. · Applied Physics Letters · 2019 · 34 citations

Oxygen Source, Engineering, Fe Hzo Films +20