Çağlar Kaya

Flash EPROM disturb mechanisms

C. Dunn, Çağlar Kaya, T.G. Lewis et al. · 1994 · 59 citations

Electrical Engineering, Engineering, Nanoelectronics +12

Effects of erase source bias on Flash EPROM device reliability

K.T. San, Çağlar Kaya, T.P. Ma · IEEE Transactions on Electron Devices · 1995 · 40 citations

Reliability, Electrical Engineering, Erase Operation +14

Polycide/metal capacitors for high precision A/D converters

Çağlar Kaya, H. L. Tigelaar, J. Paterson et al. · 2003 · 36 citations

Electrical Engineering, Engineering, Polycide/metal Capacitors +9

Reliability analysis of self-aligned bipolar transistor under forward active current stress

T.C. Chen, Çağlar Kaya, M. B. Ketchen et al. · 1986 · 31 citations

Engineering, Semiconductor Device, Reliability Engineering +16

A 240W Monolithic Class-D Audio Amplifier Output Stage

F. Nyboe, Çağlar Kaya, Lars Risbo et al. · 2006 · 26 citations

Over-current Sensing, Mixed-signal Integrated Circuit, Analog Design +3