R. S. List

Superconducting Gap in Bi-Sr-Ca-Cu-O by High-Resolution Angle-Resolved Photoelectron Spectroscopy

C. G. Olson, R. Liu, A.-B. Yang et al. · Science · 1989 · 363 citations

Electronic structure of NiO: Correlation and band effects

Zhi‐Xun Shen, R. S. List, D. S. Dessau et al. · Physical review. B, Condensed matter · 1991 · 186 citations

Engineering, Physics, Lda Band Calculation +14

Scanning capacitance spectroscopy: An analytical technique for pn-junction delineation in Si devices

Hal Edwards, Rudye McGlothlin, Richard San Martin et al. · Applied Physics Letters · 1998 · 116 citations

Engineering, Microscopy, Silicon On Insulator +16

Bonding at the K/Si(100) 2×1 interface: A surface extended x-ray-absorption fine-structure study

T. Kendelewicz, P. Soukiassian, R. S. List et al. · Physical review. B, Condensed matter · 1988 · 111 citations

Engineering, K-si Bond Length, Chemistry +16

Schottky barriers on atomically clean <i>n</i>-InP (110)

T. Kendelewicz, N. Newman, R. S. List et al. · Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena · 1985 · 55 citations