Nati Refaeli

Temperature effects and long term fading of implanted and unimplanted gate oxide RADFETs

Avner Haran, A. Jakšić, Nati Refaeli et al. · IEEE Transactions on Nuclear Science · 2004 · 49 citations

Device Modeling, Electrical Engineering, Continuous Operation +14

Mapping of Single Event Burnout in Power MOSFETs

Avner Haran, J. Barak, Dávid Dávid et al. · IEEE Transactions on Nuclear Science · 2007 · 30 citations

Reliability, Electrical Engineering, Power Mosfet +13

Characterization and Mitigation of Single-Event Transients in Xilinx 45-nm SRAM-Based FPGA

Eitan Keren, Shlomo Greenberg, Nir M. Yitzhak et al. · IEEE Transactions on Nuclear Science · 2019 · 16 citations

Electrical Engineering, Engineering, Vlsi Design +15

Single-Event Upset Tolerance Study of a Low-Voltage 13T Radiation-Hardened SRAM Bitcell

Avner Haran, Eitan Keren, Dávid Dávid et al. · IEEE Transactions on Nuclear Science · 2020 · 13 citations

Single Event Hard Errors in SRAM Under Heavy Ion Irradiation

Avner Haran, J. Barak, Dávid Dávid et al. · IEEE Transactions on Nuclear Science · 2014 · 12 citations