Charles Williams

Lateral dopant profiling in semiconductors by force microscopy using capacitive detection

David W. Abraham, Charles Williams, J. Slinkman et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1991 · 90 citations

Engineering, Microscopy, Dopant Density +20

Self-Stabilization of the Optical Frequencies and the Pulse Repetition Rate in a Coupled Optoelectronic Oscillator

Franklyn Quinlan, Charles Williams, Sarper Özharar et al. · Journal of Lightwave Technology · 2008 · 41 citations

Pulse Repetition Rate, Photonics, Optical Frequencies +14

Noise Characterization of an Injection-Locked COEO With Long-Term Stabilization

Charles Williams, Josue Davila-Rodriguez, Dimitrios Mandridis et al. · Journal of Lightwave Technology · 2011 · 40 citations

Engineering, Optical Transmission System, Allan Deviation Measurements +18

Laser writing of semiconductor nanoparticles and quantum dots

M. F. Bertino, R. R. Gadipalli, J. G. Story et al. · Applied Physics Letters · 2004 · 38 citations · Full text

Optical Materials, Silica Aerogels, Engineering +23

Multiheterodyne Detection for Spectral Compression and Downconversion of Arbitrary Periodic Optical Signals

Josue Davila-Rodriguez, Marcus Bagnell, Charles Williams et al. · Journal of Lightwave Technology · 2011 · 25 citations

Multiheterodyne Detection, Photonics, Engineering +14