Changhyun Yoo

Analysis of Self-Heating Effects in Multi-Nanosheet FET Considering Bottom Isolation and Package Options

Changhyun Yoo, Jeesoo Chang, Yoongeun Seon et al. · IEEE Transactions on Electron Devices · 2022 · 45 citations

Engineering, Integrated Circuits, Self-heating Effects +19

Device and Circuit Exploration of Multi-Nanosheet Transistor for Sub-3 nm Technology Node

Yoongeun Seon, Jeesoo Chang, Changhyun Yoo et al. · Electronics · 2021 · 33 citations · Full text

Engineering, Gate Controllability, Circuit Exploration +19

Investigation on the Effects of Interconnect RC in 3nm Technology Node Using Path-Finding Process Design Kit

Ye‐Ji Lee, Wonyeong Jang, Kyungbae Kwon et al. · IEEE Access · 2022 · 28 citations · Full text

Engineering, Vlsi Design, Interconnect Rc +16

Self-Heating and Corner Rounding Effects on Time Dependent Dielectric Breakdown of Stacked Multi-Nanosheet FETs

Jae Won Lim, Changhyun Yoo, Kiron Park et al. · IEEE Access · 2023 · 17 citations · Full text

Analytical Current–Voltage Modeling and Analysis of the MFIS Gate-All-Around Transistor Featuring Negative-Capacitance

Ye-Ji Kim, Yoongeun Seon, Soo-Won Kim et al. · Electronics · 2021 · 10 citations · Full text