Je-Hyuk Kim

Analysis of Threshold Voltage Shift for Full VGS/VDS/Oxygen-Content Span under Positive Bias Stress in Bottom-Gate Amorphous InGaZnO Thin-Film Transistors

Je-Hyuk Kim, Jun Tae Jang, Jong‐Ho Bae et al. · Micromachines · 2021 · 22 citations · Full text

Positive Bias Stress, Electrical Engineering, Engineering +11

Analysis of Drain-Induced Barrier Lowering in InGaZnO Thin-Film Transistors

Tae Jun Yang, Je-Hyuk Kim, Chang II Ryoo et al. · IEEE Transactions on Electron Devices · 2022 · 18 citations

Semiconductors, Device Modeling, Electrical Engineering +12

Device modeling of two-steps oxygen anneal-based submicron InGaZnO back-end-of-line field-effect transistor enabling short-channel effects suppression

Donguk Kim, Je-Hyuk Kim, Woo Sik Choi et al. · Scientific Reports · 2022 · 13 citations · Full text

Reliability-Aware SPICE Compatible Compact Modeling of IGZO Inverters on a Flexible Substrate

Je-Hyuk Kim, Youngjin Seo, Jun Tae Jang et al. · Applied Sciences · 2021 · 11 citations · Full text