J.A. Pals

Properties of Au, Pt, Pd and Rh levels in silicon measured with a constant capacitance technique

J.A. Pals · Solid-State Electronics · 1974 · 150 citations

Electrical Engineering, Engineering, Rh Levels +6

Electronic transport in low-dimensional structures

J. J. Harris, J.A. Pals, R. Woltjer · Reports on Progress in Physics · 1989 · 94 citations

Engineering, Charge Carriers, Charge Transport +16

Josephson effect between superconductors in possibly different spin-pairing states

J.A. Pals, W. van Haeringen, M.H. van Maaren · Physical review. B, Solid state · 1977 · 91 citations

Superconducting Material, Engineering, Bismuth-based Superconductors +22

Silicon-on-Insulator Wafer Bonding-Wafer Thinning Technological Evaluations

J. Haisma, G. A. C. M. Spierings, U. Biermann et al. · Japanese Journal of Applied Physics · 1989 · 85 citations

Engineering, Integrated Circuits, Thin Film Process Technology +22

Measurement of the order-parameter relaxation in superconducting Al-strips

J.A. Pals, J. H. Wolter · Physics Letters A · 1979 · 71 citations

Superconducting Material, High-tc Superconductivity, Engineering +7