Publication | Closed Access
Properties of Au, Pt, Pd and Rh levels in silicon measured with a constant capacitance technique
150
Citations
16
References
1974
Year
Electrical EngineeringEngineeringRh LevelsPhysicsSurface ScienceApplied PhysicsSemiconductor Device FabricationSilicon On InsulatorConstant Capacitance Technique
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