Sebastian Oestreich

Feasibility of transmission x-ray microscopy at 4 keV with spatial resolutions below 150 nm

Burkhard Kaulich, Sebastian Oestreich, M. Salomé et al. · Applied Physics Letters · 1999 · 61 citations

Engineering, Microscopy, Polycapillary Optics +25

<title>Progress in Mo/Si multilayer coating technology for EUVL optics</title>

Eric Louis, Andrey Yakshin, Peter C. Goerts et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2000 · 45 citations

Materials Science, Materials Engineering, Electrical Engineering +14

<title>New PTB beamlines for high-accuracy EUV reflectometry at BESSY II</title>

Frank Scholze, Burkhard Beckhoff, G. Mirek Brandt et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2000 · 33 citations

Photonics, Engineering, Physics +13

Single-movement fixed-exit channelcut x-ray monochromator based on profiled surfaces

Sebastian Oestreich, Burkhard Kaulich, Jean Susini · Review of Scientific Instruments · 1999 · 31 citations

Optical Materials, Engineering, Microscopy +19

<title>Multilayer reflectance during exposure to EUV radiation</title>

Sebastian Oestreich, R. Klein, Frank Scholze et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2000 · 17 citations

Short Wavelength Optic, Optical Materials, Engineering +22