Yuan Chen

Degradation Behavior and Mechanisms of E-Mode GaN HEMTs With p-GaN Gate Under Reverse Electrostatic Discharge Stress

Yiqiang Chen, Jingtai Feng, J. L. Wang et al. · IEEE Transactions on Electron Devices · 2020 · 49 citations

Engineering, Electrical Engineering, Materials Engineering +17

Time-Dependent Threshold Voltage Instability Mechanisms of p-GaN Gate AlGaN/GaN HEMTs Under High Reverse Bias Conditions

Shanjie Li, Zhiyuan He, Rui Gao et al. · IEEE Transactions on Electron Devices · 2020 · 30 citations

Engineering, Electrical Engineering, Materials Science +17

Time-Dependent Degradation Mechanism of 1.2 kV SiC MOSFET Under Long-Term High-Temperature Gate Bias Stress

Yutong Shen, Zhiyuan He, Yijun Shi et al. · IEEE Transactions on Electron Devices · 2022 · 25 citations

Engineering, Electrical Engineering, Materials Science +17

Collaborative Online RUL Prediction of Multiple Assets With Analytically Recursive Bayesian Inference

Weiwen Peng, Yuan Chen, Ancha Xu et al. · IEEE Transactions on Reliability · 2023 · 25 citations

Business, Systems Engineering, Predictive Analytics +15

Competitive Failures Decoupling and Mechanisms Analysis of SiC MOSFET Module Under Power Cycling Stress

Yidian Shi, Yuan Chen, Cheng Peng et al. · IEEE Journal of Emerging and Selected Topics in Power Electronics · 2023 · 25 citations

Engineering, Electrical Engineering, Materials Engineering +17