Cheryl Hartfield

Hardware and Techniques for Cross- Correlative TEM and Atom Probe Analysis

Brian P. Gorman, David R. Diercks, Norman Salmon et al. · Microscopy Today · 2008 · 88 citations · Full text

Natural Sciences, Materials Science, Physics +16

Adhesion strength measurement of polymer dielectric interfaces using laser spallation technique

Soma Sekhar V. Kandula, Cheryl Hartfield, Philippe H. Geubelle et al. · Thin Solid Films · 2008 · 53 citations

Natural Sciences, Materials Engineering, Materials Science +16

Interface Reliability Assessments for Copper/Low-k Products

Cheryl Hartfield, E.T. Ogawa, Y.-J. Park et al. · IEEE Transactions on Device and Materials Reliability · 2004 · 48 citations

Engineering, Materials Engineering, Materials Science +17

Making the practically impossible “Merely difficult”—Cryogenic <scp>FIB</scp> lift‐out for “Damage free” soft matter imaging

Christopher Parmenter, Michael W. Fay, Cheryl Hartfield et al. · Microscopy Research and Technique · 2016 · 43 citations · Full text

Engineering, Materials Engineering, Materials Science +11

From PCB to BEOL: 3D X-Ray Microscopy for Advanced Semiconductor Packaging

Cheryl Hartfield, Christian Schmidt, Allen Gu et al. · 2018 · 23 citations

Natural Sciences, Materials Engineering, Materials Science +17