M.M. El-Gomati

Structure determination by cryoEM at 100 keV

Greg McMullan, Katerina Naydenova, Daniel B. Mihaylov et al. · Proceedings of the National Academy of Sciences · 2023 · 45 citations · Full text

Very-low-energy electron microscopy of doped semiconductors

M.M. El-Gomati, Torquil Wells · Applied Physics Letters · 2001 · 44 citations

Semiconductors, Materials Science, Engineering +14

Imaging of the boron doping in silicon using low energy SEM

Ilona Müllerová, M.M. El-Gomati, L. Frank · Ultramicroscopy · 2002 · 41 citations

Electrical Engineering, Low Energy Sem, Engineering +8

Why is it That Differently Doped Regions in Semiconductors are Visible in Low Voltage SEM?

M.M. El-Gomati, Torquil Wells, Ilona Müllerová et al. · IEEE Transactions on Electron Devices · 2004 · 31 citations

Engineering, Microscopy, Electron Diffraction +18

Low temperature reactive ion etching of silicon with SF6/O2 plasmas

Thresa A. Wells, M.M. El-Gomati, John A. Wood · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1997 · 27 citations

Materials Science, Ion Implantation, Liquid Nitrogen +14