Statistics
Publications
1
Citations
10
H-Index
1
Active since
2010
Affiliations
Hycon Soo Park is an author at University of Modena and Reggio Emilia specializing in materials science, electrical characterization, and cmos circuit design.
Publications per year
2010–2010
1
1
Charge loss in TANOS devices caused by Vt sensing measurements during retention
Hycon Soo Park, G. Bersuker, D. C. Gilmer et al. · 2010 · 10 citations · Full text
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