Sediment export by water from an agricultural catchment in the Loam Belt of central Belgium

An Steegen, Gérard Govers, Jeroen Nachtergaele, +3

Geomorphology

EngineeringSediment QualityWater ResourcesSediment ExportSedimentation +9

The value of a physically based model versus an empirical approach in the prediction of ephemeral gully erosion for loess-derived soils

Jeroen Nachtergaele, Jean Poesen, An Steegen, +4

Geomorphology

Soil ErosionEphemeral Gully ErosionEarth ScienceEngineeringErosion Prediction +8

Materials aspects, electrical performance, and scalability of Ni silicide towards sub-0.13 μm technologies

A. Lauwers, An Steegen, Muriel de Potter, +4

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena

EngineeringElectrical PerformanceSilicon On InsulatorTi CapSilicene +14

Catchment-scale carbon redistribution and delivery by water erosion in an intensively cultivated area

Zhengang Wang, Gérard Govers, An Steegen, +5

Geomorphology

Soil ErosionCarbon SequestrationSurface RunoffEarth ScienceEngineering +8

Factors Controlling Sediment and Phosphorus Export from Two Belgian Agricultural Catchments

An Steegen, Gérard Govers, I Takken, +3

Journal of Environmental Quality

Characteristics of sediment deposits formed by intense rainfall events in small catchments in the Belgian Loam Belt

L Beuselinck, An Steegen, Gérard Govers, +3

Geomorphology

Intense Rainfall EventsEarth ScienceEngineeringCatchment ScaleGeomorphology +10

A cost effective 32nm high-K/ metal gate CMOS technology for low power applications with single-metal/gate-first process

X. Chen, S. Samavedam, Vijay Narayanan, +43

Low-power ElectronicsLow Power ApplicationsElectrical EngineeringEngineeringVlsi Design +12

Effects of tillage on runoff and erosion patterns

I Takken, Gérard Govers, Victor Jetten, +3

Soil and Tillage Research

Soil ErosionEngineeringLand UseGeographySocial Sciences +4

<i>In situ</i> transmission electron microscopy study of Ni silicide phases formed on (001) Si active lines

V. S. Teodorescu, L. C. Nistor, H. Bender, +4

Journal of Applied Physics

Materials ScienceEngineeringMonosilicide LayerCrystalline DefectsSi Active Lines +10

Strained Si CMOS (SS CMOS) technology: opportunities and challenges

K. Rim, Robert E. Anderson, D. Boyd, +23

Solid-State Electronics

Electrical EngineeringEngineeringNanoelectronicsApplied PhysicsSi Cmos +4