Yoon‐Ha Jeong - Concepedia

Author

Yoon‐Ha Jeong

Pohang University of Science and Technology

Also Known As

Yoon-Ha Jeong, Yoon-Ha Jeong Yoon-Ha Jeong, Yoon‐Ha Jeong

Publications

397

Citations

H-Index

Concepts

All Affiliations

Pohang University of Science and Technology Samsung (South Korea)

About

Yoon‐Ha Jeong is an author at Pohang University of Science and Technology specializing in engineering, electrical engineering, and microelectronics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	11	19	305
2	Electrical Engineering	11	17	264
3	Applied Physics	9	9	169
4	Computer Engineering	3	3	48
5	Materials Engineering	1	1	16

Yoon‐Ha Jeong

Publications

348

Citations

H-Index

Page 1

	Year	Citations
A Technique for Extracting Small-Signal Equivalent-Circuit Elements of HEMTs Man‐Young Jeon, Byung‐Gyu Kim, Youngjin Jeon, Open Access System for Information Sharing (Pohang University of Science and Technology)	1999	43
Sulfide treated GaAs MISFET's with gate insulator of photo-CVD grown P/sub 3/N/sub 5/ film Yoon‐Ha Jeong, Ki-Hawn Choi, Seong-Kue Jo IEEE Electron Device Letters SemiconductorsSemiconductor TechnologyElectrical EngineeringElectronic DevicesEngineering	1994	32
Composition of phosphorus-nitride film deposited on InP surfaces by a photochemical vapor deposition technique and electrical properties of the interface Yoon‐Ha Jeong, Jae‐Hak Lee, Young-Ho Bae, Applied Physics Letters Nh3 GasesEngineeringChemical DepositionElectrical PropertiesSemiconductors	1990	30
Performance of Single-Electron Transistor Logic Composed of Multi-gate Single-Electron Transistors Moon-Young Jeong Moon-Young Jeong, Yoon‐Ha Jeong, Sung-Woo Hwang, Japanese Journal of Applied Physics Electrical EngineeringEngineeringVlsi DesignCircuit DesignCircuit System	1997	27
Effects of photochemical vapor deposition phosphorus-nitride interfacial layer on electrical characteristics of Au-InP Schottky diodes Yoon‐Ha Jeong, G. B. Kim, Seok-Tae Kim, Journal of Applied Physics EngineeringOptoelectronic DevicesSemiconductorsElectrical CharacteristicsIi-vi Semiconductor	1991	22
Enhancement mode InP MISFET's with sulfide passivation and photo-CVD grown P<sub>3</sub>N<sub>5</sub> gate insulators Yoon‐Ha Jeong, Seong-Kue Jo, Bong-Hoon Lee, IEEE Electron Device Letters SemiconductorsSemiconductor TechnologyElectrical EngineeringElectronic DevicesEngineering	1995	19
Electrostatic Discharge Robustness of Si Nanowire Field-Effect Transistors Juin J. Liou, Andy Chung, Yoon‐Ha Jeong, IEEE Electron Device Letters Device ModelingElectrical EngineeringSemiconductor DeviceEngineeringElectrostatic Discharge	2009	18
Effects of Sulfide Passivation on the Performance of GaAs MISFETs with Photo-CVD Grown P<sub>3</sub>N<sub>5</sub> Gate Insulators Yoon‐Ha Jeong, Kihwan Choi, Seong-Kue Jo, Japanese Journal of Applied Physics SemiconductorsSemiconductor TechnologyElectrical EngineeringElectronic DevicesEngineering	1995	16
A Study of Strain Engineering Using CESL Stressor on Reliability Comparing Effect of Intrinsic Mechanical Stress Kyong Taek Lee, Chang Yong Kang, Min Sang Park, IEEE Electron Device Letters EngineeringMechanical EngineeringReliability CharacteristicsResidual StressReliability Comparing Effect	2009	16
A highly linear and efficient three‐way Doherty amplifier using two‐stage GaN HEMT cells for repeater systems Yong‐Sub Lee, Mun‐Woo Lee, S. Kam, Microwave and Optical Technology Letters Electrical EngineeringEngineeringRf SemiconductorRepeater SystemsElectronic Engineering	2009	15

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