M. Ahmad

Atomic-layer by atomic-layer compositional depth profiling: Surface segregation and impurity cosegregation of Pt-Rh and Pt-Ru alloys

Tien T. Tsong, Dexin Ren, M. Ahmad · Physical review. B, Condensed matter · 1988 · 78 citations

Engineering, Chemistry, Corrosion +16

Snoek relaxation peaks in solid solutions of niobium

M. Ahmad, Z.C. Szkopiak · Journal of Physics and Chemistry of Solids · 1970 · 53 citations

Relaxation Process, Engineering, Physics +6

Compositional variations in the near surface layers, an atom-probe study of cosegregation of sulfur in Pt–Rh and Pt–Ir alloys

M. Ahmad, Tien T. Tsong · The Journal of Chemical Physics · 1985 · 50 citations

Engineering, Chemistry, Atom-probe Study +16

Surface segregation and diffusion kinetics study of a Pt-Ir alloy using the time-of-flight atom-probe field ion microscope

M. Ahmad, Tien T. Tsong · Applied Physics Letters · 1984 · 29 citations

Engineering, Microscopy, Ion Implantation +20

Early stages of silicide formation on W, Ni, and Pt surfaces, an atom probe, and field ion microscope study

Tien T. Tsong, S. C. Wang, F. H. Liu et al. · Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena · 1983 · 26 citations

Engineering, Field Ion Microscope, Atom Probe +20