Surface segregation and diffusion kinetics study of a Pt-Ir alloy using the time-of-flight atom-probe field ion microscope

Abstract

Two absolute composition depth profiles of single atomic layer depth resolution have been obtained for the (001) surface of a Pt-20% Ir alloy. Pt segregates only to the top two surface layers. A feature of a diffusion kinetic effect has also been observed from which diffusion parameters of alloy species in the near surface layers are estimated.