C.M. Yih

Statistics

Publications

Citations

105

H-Index

Active since

1997

Affiliations

National Yang Ming Chiao Tung University(Current)

Taiwan Semiconductor Manufacturing Company (Taiwan)

C.M. Yih is an author at National Yang Ming Chiao Tung University specializing in microelectronics, semiconductor reliability, and electrical engineering.

Publications per year

1997–2003

Publications

A unified approach to profiling the lateral distributions of both oxide charge and interface states in n-MOSFET's under various bias stress conditions

Shui-Ming Cheng, C.M. Yih, Jun-Chyi Yeh et al. · IEEE Transactions on Electron Devices · 1997 · 31 citations

Engineering, Electrical Engineering, Interface Science +16

A new approach to simulating n-MOSFET gate current degradation by including hot-electron induced oxide damage

C.M. Yih, Shui-Ming Cheng, Steve S. Chung · IEEE Transactions on Electron Devices · 1998 · 18 citations

Engineering, Electrical Engineering, Microelectronics +16

A Spice-compatible flash EEPROM model feasible for transient and program/erase cycling endurance simulation

Steve S. Chung, C.M. Yih, Shuo Wu et al. · 2003 · 17 citations

Engineering, Computer Engineering, Electrical Engineering +17

Performance and reliability evaluations of p-channel flash memories with different programming schemes

Steve S. Chung, S.N. Kuo, C.M. Yih et al. · 2002 · 15 citations

Engineering, Computer Engineering, Electrical Engineering +17

A new technique for hot carrier reliability evaluations of flash memory cell after long-term program/erase cycles

Steve S. Chung, C.M. Yih, Cheng Shui-ming et al. · IEEE Transactions on Electron Devices · 1999 · 12 citations

Engineering, Computer Engineering, Electrical Engineering +17

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