Nils Kristensen

A transmission electron microscopy study of hillocks in thin aluminum films

Fredric Ericson, Nils Kristensen, Jan‐Åke Schweitz et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1991 · 81 citations

Materials Science, Aluminium Nitride, Surface Characterization +14

Residual stresses and fracture properties of magnetron sputtered Ti films on Si microelements

H. Ljungcrantz, Lars Hultman, J.‐E. Sundgren et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1993 · 57 citations

Engineering, Severe Plastic Deformation, Mechanical Engineering +18

Local stress relaxation phenomena in thin aluminum films

U. Smith, Nils Kristensen, Fredric Ericson et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1991 · 43 citations

Materials Science, Thin Aluminum Films, Engineering +15

Hole formation in thin aluminium films under controlled variation of strain and temperature

Nils Kristensen, Fredric Ericson, Jan‐Åke Schweitz et al. · Thin Solid Films · 1991 · 31 citations

Materials Science, Aluminium Nitride, Controlled Variation +11

Grain collapses in strained aluminum thin films

Nils Kristensen, Fredric Ericson, Jan‐Åke Schweitz et al. · Journal of Applied Physics · 1991 · 25 citations

Materials Science, Thin Film Physics, Thin Aluminum Films +15