Y. Takegawa

Design methodology for IC manufacturability based on regular logic-bricks

V. Kheterpal, Vyacheslav Rovner, Thiago Hersan et al. · 2005 · 92 citations

Engineering, Computer Engineering, Computer Science +17

High performance CMOSFET technology for 45nm generation and scalability of stress-induced mobility enhancement technique

A. Oishi, Osamu Fujii, T. Yokoyama et al. · 2005 · 42 citations

Engineering, Electrical Engineering, Circuit Theory +16

Suppression of crosstalk by using backside deep trench isolation for 1.12μm backside illuminated CMOS image sensor

Y. Kitamura, H. Aikawa, Katsuhiko Kakehi et al. · 2012 · 35 citations

Engineering, Electrical Engineering, Microelectronics +16

Scalability of strained silicon CMOSFET and high drive current enhancement in the 40 nm gate length technology

T. Sanuki, A. Oishi, Y. Morimasa et al. · 2004 · 35 citations

Engineering, Electrical Engineering, Microelectronics +16

Design methodology for IC manufacturability based on regular logic-bricks

V. Kheterpal, Vyacheslav Rovner, Thiago Hersan et al. · Proceedings. 42nd Design Automation Conference, 2005. · 2005 · 33 citations

Engineering, Computer Engineering, Computer Science +17