L.S. Vempati

Ionizing radiation tolerance of high-performance SiGe HBT's grown by UHV/CVD

J.A. Babcock, John D. Cressler, L.S. Vempati et al. · IEEE Transactions on Nuclear Science · 1995 · 87 citations

Electrical Engineering, Ion Implantation, Engineering +14

Low-frequency noise in UHV/CVD epitaxial Si and SiGe bipolar transistors

L.S. Vempati, John D. Cressler, J.A. Babcock et al. · IEEE Journal of Solid-State Circuits · 1996 · 82 citations

Electrical Engineering, Engineering, Rf Semiconductor +12

Low-frequency noise characteristics of UHV/CVD epitaxial Si- and SiGe-base bipolar transistors

John D. Cressler, L.S. Vempati, J.A. Babcock et al. · IEEE Electron Device Letters · 1996 · 46 citations

Electrical Engineering, Sige-base Bipolar Transistors, Engineering +13

Ionizing radiation tolerance and low-frequency noise degradation in UHV/CVD SiGe HBT's

J.A. Babcock, John D. Cressler, L.S. Vempati et al. · IEEE Electron Device Letters · 1995 · 35 citations

Minor Degradation, Engineering, Nuclear Physics +27

Correlation of low-frequency noise and emitter-base reverse-bias stress in epitaxial Si- and SiGe-base bipolar transistors

J.A. Babcock, John D. Cressler, L.S. Vempati et al. · 2002 · 26 citations

Electrical Engineering, Sige-base Bipolar Transistors, Engineering +15