N. Arpatzanis

Study of the Drain Leakage Current in Bottom-Gated Nanocrystalline Silicon Thin-Film Transistors by Conduction and Low-Frequency Noise Measurements

Argyrios T. Hatzopoulos, N. Arpatzanis, D.H. Tassis et al. · IEEE Transactions on Electron Devices · 2007 · 17 citations

Engineering, Drain Leakage, Drain Junction +17

A simple and continuous polycrystalline silicon thin-film transistor model for <scp>SPICE</scp> implementation

Ilias O. Pappas, Argyrios T. Hatzopoulos, D.H. Tassis et al. · Journal of Applied Physics · 2006 · 16 citations

Device Modeling, Aim-spice Circuit Simulator, Electrical Engineering +12

Electrical and noise characterization of bottom-gated nanocrystalline silicon thin-film transistors

Argyrios T. Hatzopoulos, N. Arpatzanis, D.H. Tassis et al. · Journal of Applied Physics · 2006 · 15 citations

Semiconductors, Semiconductor Technology, Electrical Engineering +14

Analytical current-voltage model for nanocrystalline silicon thin-film transistors

Argyrios T. Hatzopoulos, Ilias O. Pappas, D.H. Tassis et al. · Applied Physics Letters · 2006 · 14 citations

Device Modeling, Electrical Engineering, Band Tail States +10

Neutron radiation effects in high electron mobility transistors [AlGaAs/GaAs]

M. Papastamatiou, N. Arpatzanis, G. Papaioannou et al. · IEEE Transactions on Electron Devices · 1997 · 13 citations

Electrical Engineering, Fast Neutron Radiation, Engineering +9