T. H. Ghong

Parametric modeling of the dielectric functions of Cd1−xMgxTe alloy films

Y. S. Ihn, T.J. Kim, T. H. Ghong et al. · Thin Solid Films · 2004 · 30 citations

Materials Science, Materials Engineering, Ii-vi Semiconductor +6

InAs critical-point energies at 22 K from spectroscopic ellipsometry

Tae Jung Kim, Jae Jin Yoon, Soon Yong Hwang et al. · Applied Physics Letters · 2010 · 24 citations

Engineering, Physics, Crystalline Defects +13

Dielectric response of AlSb from 0.7 to 5.0 eV determined by <i>in situ</i> ellipsometry

Y. W. Jung, T. H. Ghong, Jeoung-Woo Byun et al. · Applied Physics Letters · 2009 · 15 citations

Semiconductors, Materials Science, Pseudodielectric Function Data +15

Effect of overlayers on critical-point parameters in the analysis of ellipsometric spectra

Y. W. Jung, T. H. Ghong, Y. D. Kim et al. · Applied Physics Letters · 2007 · 15 citations

Ii-vi Semiconductor, Ellipsometric Spectra, Electrical Engineering +14

Optical properties of InxAl1−xAs alloy films

Jaeseung Yoon, T. H. Ghong, Jeoung-Woo Byun et al. · Applied Physics Letters · 2008 · 14 citations

Optical Materials, Engineering, Inxal1−xas Alloy Films +17