Y. W. Jung

Dielectric function and critical points of AlP determined by spectroscopic ellipsometry

Soon Yong Hwang, T.J. Kim, Y. W. Jung et al. · Journal of Alloys and Compounds · 2013 · 22 citations

Materials Science, Dielectric Function, Aluminium Nitride +10

Ellipsometric analysis of porous anodized aluminum oxide films

Y. W. Jung, Jeoung-Woo Byun, Deok Ha Woo et al. · Thin Solid Films · 2009 · 17 citations

Materials Engineering, Aluminum Oxide Films, Materials Science +5

Dielectric response of AlSb from 0.7 to 5.0 eV determined by <i>in situ</i> ellipsometry

Y. W. Jung, T. H. Ghong, Jeoung-Woo Byun et al. · Applied Physics Letters · 2009 · 15 citations

Semiconductors, Materials Science, Pseudodielectric Function Data +15

Effect of overlayers on critical-point parameters in the analysis of ellipsometric spectra

Y. W. Jung, T. H. Ghong, Y. D. Kim et al. · Applied Physics Letters · 2007 · 15 citations

Ii-vi Semiconductor, Ellipsometric Spectra, Electrical Engineering +14

Model dielectric functions for AlxGa1−xAs alloys of arbitrary compositions

Y. W. Jung, Tae Jung Kim, Jaeseung Yoon et al. · Journal of Applied Physics · 2008 · 13 citations

Materials Engineering, Materials Science, Dielectric Function +13