Hussam Muhamedsalih

Fast surface measurement using wavelength scanning interferometry with compensation of environmental noise

Xiangqian Jiang, Kaiwei Wang, Feng Gao et al. · Applied Optics · 2010 · 113 citations · Full text

Semiconductor Daughterboard, Engineering, Coherent Gradient Sensing +15

Surface and thickness measurement of a transparent film using wavelength scanning interferometry

Feng Gao, Hussam Muhamedsalih, Xiangqian Jiang · Optics Express · 2012 · 70 citations · Full text

Optical Materials, Film Thickness Map, Engineering +24

Application of Clustering Filter for Noise and Outlier Suppression in Optical Measurement of Structured Surfaces

Shan Lou, Dawei Tang, Wenhan Zeng et al. · IEEE Transactions on Instrumentation and Measurement · 2020 · 26 citations · Full text

Outlier Suppression, Engineering, Optical Testing +17

Comparison study of algorithms and accuracy in the wavelength scanning interferometry

Hussam Muhamedsalih, Feng Gao, Xiangqian Jiang · Applied Optics · 2012 · 25 citations · Full text

Surface Measurement, Interference Fringe Pattern, Engineering +15

Fabrication and characterisation of metal-doped pectin films

I. Kalathaki, Katerina Alba, Hussam Muhamedsalih et al. · Food Hydrocolloids · 2019 · 24 citations

Materials Science, Materials Engineering, Electroactive Material +4