Lynn M. Sheehan

Depth profiling of polishing-induced contamination on fused silica surfaces

Mark R. Kozlowski, Jeff Carr, I. D. Hutcheon et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1998 · 72 citations

Engineering, Fused Silica, Laser Applications +22

Extrapolation of damage test data to predict performance of large-area NIF optics at 355 nm

Michael D. Feit, Alexander M. Rubenchik, Mark R. Kozlowski et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1999 · 46 citations · Full text

Engineering, Optic Design, Optical Testing +19

<title>Advantages of evaporation of hafnium in a reactive environment formanufacture of high-damage-threshold multilayer coatings by electron-beam deposition</title>

Christopher J. Stolz, Lynn M. Sheehan, Marc K. Von Gunten et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1999 · 31 citations

Laser Conditioning, Optical Materials, Engineering +24

Effects of polishing, etching, cleaving, and water leaching on the UV laser damage of fused silica

J. M. Yoshiyama, François Y. Génin, Alberto Salleo et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1998 · 29 citations

Engineering, Fused Silica, Mechanical Engineering +19

Spectroscopic investigation of SiO 2 surfaces of optical materials for high-power lasers

Stavros G. Demos, Lynn M. Sheehan, Mark R. Kozlowski · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2000 · 13 citations

Optical Materials, Engineering, Silicon On Insulator +17