J. M. Yoshiyama

Rear-surface laser damage on 355-nm silica optics owing to Fresnel diffraction on front-surface contamination particles

François Y. Génin, Michael D. Feit, Mark R. Kozlowski et al. · Applied Optics · 2000 · 80 citations

Vapor etching of ion tracks in fused silica

R. G. Musket, J. M. Yoshiyama, R.J. Contolini et al. · Journal of Applied Physics · 2002 · 41 citations

Engineering, Vacuum Device, Silicon On Insulator +18

Laser-induced damage of fused silica at 355 nm initiated at scratches

Alberto Salleo, François Y. Génin, J. M. Yoshiyama et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1998 · 33 citations

Engineering, Fused Silica, Mechanical Engineering +17

Effects of polishing, etching, cleaving, and water leaching on the UV laser damage of fused silica

J. M. Yoshiyama, François Y. Génin, Alberto Salleo et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1998 · 29 citations

Engineering, Fused Silica, Mechanical Engineering +19

Modeling of laser-induced surface cracks in silica at 355 nm

Michael D. Feit, Jack H. Campbell, Douglas R. Faux et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1998 · 24 citations

Engineering, Fused Silica, Mechanical Engineering +18