P.S. Gillis

Boundary-scan design principles for efficient LSSD ASIC testing

R.W. Bassett, Mark E. Turner, J.H. Panner et al. · IBM Journal of Research and Development · 1990 · 75 citations

Numerical Analysis, Engineering, Vlsi Design +18

Low-cost testing of high-density logic components

R.W. Bassett, B.J. Butkus, S.R. Dingle et al. · IEEE Design & Test of Computers · 1990 · 41 citations

Engineering, Vlsi Design, Mem Testing +16

Delay test of chip I/Os using LSSD boundary scan

P.S. Gillis, Frank Woytowich, K. McCauley et al. · 2002 · 40 citations

Engineering, Hardware-in-the-loop Simulation, Mem Testing +14

Low cost testing of high density logic components

R.W. Bassett, B.J. Butkus, S.L. Dingle et al. · 2003 · 37 citations

Logic Device Tester, Engineering, Computer Architecture +16

Test methodologies and design automation for IBM ASICs

P.S. Gillis, T. S. Guzowski, Brion Keller et al. · IBM Journal of Research and Development · 1996 · 35 citations

Engineering, Dft Methodologies, Electronic Design Automation +18