Frank Woytowich is an author at IBM (United States) specializing in design for testing, computer architecture, and computer engineering.
Top concepts
EngineeringSoftware TestingDesign For TestingComputer EngineeringComputer ArchitectureMicroelectronicsBuilt-in Self-testVlsi DesignCircuit DesignInstrumentation
Publications per year
1990–2006
4
4
Delay test of chip I/Os using LSSD boundary scan
P.S. Gillis, Frank Woytowich, K. McCauley et al. · 2002 · 40 citations
Engineering, Hardware-in-the-loop Simulation, Mem Testing +14
Gross delay defect evaluation for a CMOS logic design system product
O. Bula, J. Moser, J. Trinko et al. · IBM Journal of Research and Development · 1990 · 29 citations
Low overhead delay testing of ASICs
P.S. Gillis, K. McCauley, Frank Woytowich et al. · 2005 · 20 citations
Engineering, Computer Architecture, Software Engineering +18
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