E. G. Brazel

Scanning capacitance microscopy imaging of threading dislocations in GaN films grown on (0001) sapphire by metalorganic chemical vapor deposition

P. Hansen, Y. E. Strausser, Andrew Erickson et al. · Applied Physics Letters · 1998 · 261 citations

Materials Science, Aluminium Nitride, Electrical Engineering +15

Direct observation of localized high current densities in GaN films

E. G. Brazel, M. A. Chin, V. Narayanamurti · Applied Physics Letters · 1999 · 139 citations

Wide-bandgap Semiconductor, Semiconductor Technology, Electrical Engineering +13

Electrical characterization of semiconductor materials and devices using scanning probe microscopy

Peter Wolf, E. G. Brazel, Andrew Erickson · Materials Science in Semiconductor Processing · 2001 · 49 citations

Materials Science, Semiconductors, Electrical Engineering +13

Ballistic electron emission microscopy study of transport in GaN thin films

E. G. Brazel, M. A. Chin, V. Narayanamurti et al. · Applied Physics Letters · 1997 · 31 citations

Semiconductors, Wide-bandgap Semiconductor, Electrical Engineering +15