Julien L. Colaux

Thin film depth profiling by ion beam analysis

C. Jeynes, Julien L. Colaux · The Analyst · 2016 · 115 citations · Full text

Natural Sciences, Materials Science, Physics +9

Carbon coatings with low secondary electron yield

P. Costa Pinto, S. Calatroni, H. Neupert et al. · Vacuum · 2013 · 71 citations

Natural Sciences, Materials Engineering, Materials Science +11

Building Materials from Colloidal Nanocrystal Arrays: Preventing Crack Formation during Ligand Removal by Controlling Structure and Solvation

Santosh Shaw, Bin Yuan, Xinchun Tian et al. · Advanced Materials · 2016 · 48 citations

Natural Sciences, Materials Engineering, Materials Science +17

On the traceably accurate voltage calibration of electrostatic accelerators

Julien L. Colaux, G. Terwagne, C. Jeynes · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2015 · 43 citations

Engineering, Electrical Engineering, Physics +11

Physicochemical characteristics and occupational exposure to coarse, fine and ultrafine particles during building refurbishment activities

Farhad Azarmi, Prashant Kumar, Julien L. Colaux et al. · Journal of Nanoparticle Research · 2015 · 32 citations

Public Health, Building Science, Toxicology +17