Statistics
Publications
3
Citations
89
H-Index
3
Active since
2000
J. Tao is an author at University of Illinois Urbana-Champaign specializing in carrier transport, hot carrier effects, and microelectronics.
Publications per year
2000–2003
3
3
Hot carrier effects in nMOSFETs in 0.1 μm CMOS technology
E. Li, Elyse Rosenbaum, J. Tao et al. · 2003 · 47 citations
Hot carrier induced degradation in deep submicron MOSFETs at 100°C
E. Li, Elyse Rosenbaum, Leonard F. Register et al. · 2002 · 16 citations
Engineering, Electrical Engineering, Electronic Materials +16
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