Jong‐Chang Woo

Characteristics of Nickel-doped Zinc Oxide thin films prepared by sol–gel method

Kyoung‐Tae Kim, Gwan-Ha Kim, Jong‐Chang Woo et al. · Surface and Coatings Technology · 2008 · 55 citations

Natural Sciences, Materials Engineering, Materials Science +13

Advanced source/drain engineering for box-shaped ultrashallow junction formation using laser annealing and pre-amorphization implantation in sub-100-nm SOI CMOS

Seong-Dong Kim, Cheol‐Min Park, Jong‐Chang Woo · IEEE Transactions on Electron Devices · 2002 · 50 citations

Engineering, Electrical Engineering, Materials Science +17

Low leakage current in metal-insulator-metal capacitors of structural Al2O3/TiO2/Al2O3 dielectrics

Jong‐Chang Woo, Yoon-Soo Chun, Young-Hee Joo et al. · Applied Physics Letters · 2012 · 46 citations

Natural Sciences, Electrical Engineering, Materials Science +17

Effects of N2 and NH3 remote plasma nitridation on the structural and electrical characteristics of the HfO2 gate dielectrics

K.-S. Park, K.-H. Baek, D.P. Kim et al. · Applied Surface Science · 2010 · 40 citations

Natural Sciences, Materials Science, Physics +13

Dry etching properties of TiO2 thin films in O2/CF4/Ar plasma

Kyung-Rok Choi, Jong‐Chang Woo, Young-Hee Joo et al. · Vacuum · 2012 · 36 citations

Natural Sciences, Materials Engineering, Materials Science +14