J. Stein

Charge trapping in dry and wet oxides on N-type 6H–SiC studied by Fowler–Nordheim charge injection

E.G. Stein von Kamienski, F. Portheine, J. Stein et al. · Journal of Applied Physics · 1996 · 28 citations

Materials Science, Materials Engineering, Electrical Engineering +12

Coulomb Blockade Effects in a Highly Doped Silicon Quantum Wire Fabricated on Novel Molecular Beam Epitaxy Grown Material

T. Koester, Frank Goldschmidtboeing, B. Hadam et al. · Japanese Journal of Applied Physics · 1999 · 21 citations

Electrical Engineering, Semiconductor Device, Engineering +10

Characterization of annealed oxides on n-type 6HSiC by high- and low-frequency CV-measurements

E. Stein von Kamienski, A. Gölz, J. Stein et al. · Microelectronic Engineering · 1995 · 14 citations

Implementation of Low Thermal Budget Techniques to Si and SiGe MOSFET Device Processing

Michael Glück, J. Hersener, H.G. Umbach et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena · 1997 · 11 citations

Electrical Engineering, Physical Design (Electronics), Engineering +10