Characterization of annealed oxides on n-type 6HSiC by high- and low-frequency CV-measurements - Concepedia

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Characterization of annealed oxides on n-type 6HSiC by high- and low-frequency CV-measurements

14

Citations

5

References

1995

Year

E. Stein von Kamienski, A. Gölz, J. Stein, H. Kurz

Microelectronic Engineering

References

	Year	Citations

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