T. Ambridge

An automatic carrier concentration profile plotter using an electrochemical technique

T. Ambridge, M. M. Faktor · Journal of Applied Electrochemistry · 1975 · 91 citations

Chemical Engineering, Electrical Engineering, Engineering +9

Ion implantation in compound semiconductors–an approach based on solid state theory

R. Heckingbottom, T. Ambridge · Radiation Effects · 1973 · 89 citations

Semiconductors, Materials Science, Electrical Engineering +14

Applications of Electrochemical Methods for Semiconductor Characterization: I . Highly Reproducible Carrier Concentration Profiling of VPE “Hi‐Lo”

T. Ambridge, John L. Stevenson, R.M. Redstall · Journal of The Electrochemical Society · 1980 · 73 citations

Semiconductors, Materials Science, Electrical Engineering +14

The electrochemical characterization of n-type gallium arsenide

T. Ambridge, C. R. Elliott, M. M. Faktor · Journal of Applied Electrochemistry · 1973 · 30 citations

N-type Gallium Arsenide, Gallium Oxide, Chemistry +2

Electrochemical carrier concentration profiling in silicon

Catherine Sharpe, P. Lilley, C. R. Elliott et al. · Electronics Letters · 1979 · 27 citations

Engineering, Silicon On Insulator, Electrochemical Technique +16