John L. Stevenson

Applications of Electrochemical Methods for Semiconductor Characterization: I . Highly Reproducible Carrier Concentration Profiling of VPE “Hi‐Lo”

T. Ambridge, John L. Stevenson, R.M. Redstall · Journal of The Electrochemical Society · 1980 · 73 citations

Semiconductors, Materials Science, Electrical Engineering +14

Growth of single crystals of meta-nitroaniline and the evaluation of its electro-optic properties

S. Ayers, M. M. Faktor, David W. M. Marr et al. · Journal of Materials Science · 1972 · 51 citations

Materials Science, Single Crystals, Engineering +10

X-Ray crystal structure of the electro-optic material meta-nitroaniline

A. C. Skapski, John L. Stevenson · Journal of the Chemical Society Perkin Transactions 2 · 1973 · 51 citations

X-ray Crystallography, Crystal Structure, Engineering +18

The Detection of Structural Defects in GaAs by Electrochemical Etching

M. M. Faktor, John L. Stevenson · Journal of The Electrochemical Society · 1978 · 50 citations · Full text

Engineering, Selective Discrimination, Semiconductor Device +17

The linear electro-optic coefficients of meta-nitroaniline

John L. Stevenson · Journal of Physics D Applied Physics · 1973 · 47 citations

Photonics, Electromagnetic Metamaterials, Optical Materials +14