John P. Reifenberg

Phase Change Memory

H.‐S. Philip Wong, Simone Raoux, Sang‐Bum Kim et al. · Proceedings of the IEEE · 2010 · 1.8K citations

Engineering, Materials Engineering, Materials Science +15

Thickness and stoichiometry dependence of the thermal conductivity of GeSbTe films

John P. Reifenberg, Matthew A. Panzer, Sang‐Bum Kim et al. · Applied Physics Letters · 2007 · 125 citations

Natural Sciences, Materials Engineering, Materials Science +17

Thermal Boundary Resistance Measurements for Phase-Change Memory Devices

John P. Reifenberg, Kuo‐Wei Chang, Matthew A. Panzer et al. · IEEE Electron Device Letters · 2009 · 122 citations

Engineering, Materials Engineering, Materials Science +17

The Impact of Thermal Boundary Resistance in Phase-Change Memory Devices

John P. Reifenberg, D.L. Kencke, Kenneth E. Goodson · IEEE Electron Device Letters · 2008 · 120 citations

Engineering, Materials Engineering, Materials Science +17

Thermal conductivity anisotropy and grain structure in Ge2Sb2Te5 films

Jaeho Lee, Zijian Li, John P. Reifenberg et al. · Journal of Applied Physics · 2011 · 86 citations

Natural Sciences, Materials Science, Physics +17