John P. Reifenberg

Phase Change Memory

H.‐S. Philip Wong, Simone Raoux, Sang‐Bum Kim et al. · Proceedings of the IEEE · 2010 · 1.7K citations

Materials Science, Materials Engineering, Electrical Engineering +14

Thickness and stoichiometry dependence of the thermal conductivity of GeSbTe films

John P. Reifenberg, Matthew A. Panzer, Sang‐Bum Kim et al. · Applied Physics Letters · 2007 · 123 citations

Materials Science, Gesbte Films, Electrical Engineering +15

Thermal Boundary Resistance Measurements for Phase-Change Memory Devices

John P. Reifenberg, Kuo‐Wei Chang, Matthew A. Panzer et al. · IEEE Electron Device Letters · 2009 · 120 citations

Engineering, Energy Efficiency, Thermal Interfaces +18

The Impact of Thermal Boundary Resistance in Phase-Change Memory Devices

John P. Reifenberg, D.L. Kencke, Kenneth E. Goodson · IEEE Electron Device Letters · 2008 · 119 citations

Engineering, Computer Architecture, Writing Time +16

Thermal conductivity anisotropy and grain structure in Ge2Sb2Te5 films

Jaeho Lee, Zijian Li, John P. Reifenberg et al. · Journal of Applied Physics · 2011 · 83 citations

Materials Science, Materials Engineering, Phase-change Material +14