W. Kanert

HCI vs. BTI? - Neither one's out

Christian Schlünder, S. Aresu, Georg Georgakos et al. · 2012 · 34 citations

Engineering, Electrical Engineering, Materials Science +17

Active cycling reliability of power devices: Expectations and limitations

W. Kanert · Microelectronics Reliability · 2012 · 26 citations

Engineering, Electrical Engineering, Electronic Materials +13

Reliability challenges for power devices under active cycling

W. Kanert · 2009 · 23 citations

Engineering, Electrical Engineering, Microelectronics +15

Degradation of moulding compounds during highly accelerated stress tests. A simple approach to study adhesion by performing button shear tests

R. Pufall, Michael Goroll, Joachim Mahler et al. · 2011 · 15 citations

Engineering, Materials Engineering, Materials Science +17

Degradation of moulding compounds during highly accelerated stress tests – A simple approach to study adhesion by performing button shear tests

R. Pufall, Michael Goroll, Joachim Mahler et al. · Microelectronics Reliability · 2012 · 12 citations

Engineering, Materials Engineering, Materials Science +11