Fumihiro Fujie

Detection of edge component of threading dislocations in GaN by Raman spectroscopy

Nobuhiko Kokubo, Yosuke Tsunooka, Fumihiro Fujie et al. · Applied Physics Express · 2018 · 24 citations

Natural Sciences, Materials Engineering, Materials Science +17

Synchrotron X-ray topographic image contrast variation of screw-type basal plane dislocations located at different depths below the crystal surface in 4H-SiC

Fumihiro Fujie, Hongyu Peng, Tuerxun Ailihumaer et al. · Acta Materialia · 2021 · 24 citations

Natural Sciences, Materials Engineering, Materials Science +16

Nondestructive visualization of threading dislocations in GaN by micro raman mapping

Nobuhiko Kokubo, Yosuke Tsunooka, Fumihiro Fujie et al. · Japanese Journal of Applied Physics · 2019 · 20 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +15

Determination of edge-component Burgers vector of threading dislocations in GaN crystal by using Raman mapping

Nobuhiko Kokubo, Yosuke Tsunooka, Fumihiro Fujie et al. · Applied Physics Express · 2018 · 15 citations

Natural Sciences, Materials Engineering, Materials Science +15

Direct observation of stacking fault shrinkage in 4H-SiC at high temperatures by <i>in-situ</i> X-ray topography using monochromatic synchrotron radiation

Fumihiro Fujie, Shunta Harada, H. Koizumi et al. · Applied Physics Letters · 2018 · 14 citations

Natural Sciences, Materials Engineering, Materials Science +16