B. C. Valek - Concepedia

Concepedia

Author

B. C. Valek

Stanford University

Also Known As

B. C. Valek, B. Valek, B.C Valek, B.C. Valek, Bryan Valek

38

Publications

1.2K

Citations

14

H-Index

27

Concepts

All Affiliations

Stanford University Lawrence Berkeley National Laboratory Advanced Light Source Intel (United States)Stanford Synchrotron Radiation Lightsource

BC

About

B. C. Valek is an author at Stanford University specializing in engineering, microstructure, and applied physics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	14	17	1.2K
2	Applied Physics	13	15	1.2K
3	Materials Engineering	11	11	947
4	Natural Sciences	1	1	182
5	Electrical Engineering	1	1	74

B. C. Valek

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17

Publications

1.2K

Citations

14

H-Index

	Year	Citations
Scanning X-ray microdiffraction with submicrometer white beam for strain/stress and orientation mapping in thin films Nobumichi Tamura, Alastair A. MacDowell, Ralph Spolenak, Journal of Synchrotron Radiation X-ray SpectroscopyEngineeringSevere Plastic DeformationMicroscopyOrientation Mapping	2003	266
Submicron x-ray diffraction and its applications to problems in materials and environmental science Nobumichi Tamura, Richard Celestre, Alastair A. MacDowell, Review of Scientific Instruments X-ray CrystallographyX-ray SpectroscopyEngineeringMicroscopySynchrotron Radiation Source	2002	182
Submicron X-ray diffraction Alastair A. MacDowell, Richard Celestre, Nobumichi Tamura, Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment Synchrotron RadiationEngineeringX-ray DiffractionApplied PhysicsDiffraction	2001	102
Crystal plasticity in Cu damascene interconnect lines undergoing electromigration as revealed by synchrotron x-ray microdiffraction Arief Suriadi Budiman, William D. Nix, Nobumichi Tamura, Applied Physics Letters Point DefectsEngineeringSevere Plastic DeformationSynchrotron X-ray MicrodiffractionInterconnect (Integrated Circuits)	2006	101
High spatial resolution grain orientation and strain mapping in thin films using polychromatic submicron x-ray diffraction Nobumichi Tamura, Alastair A. MacDowell, Richard Celestre, Applied Physics Letters X-ray SpectroscopyEngineeringSevere Plastic DeformationMicroscopyX-ray Synchrotron Technique	2002	87
Electromigration-induced plastic deformation in passivated metal lines B. C. Valek, J. C. Bravman, Nobumichi Tamura, Applied Physics Letters EngineeringSevere Plastic DeformationMechanical EngineeringMicrostructure-strength RelationshipElectronic Packaging	2002	86
Electromigration-induced microstructure evolution in tin studied by synchrotron x-ray microdiffraction Albert T. Wu, K. N. Tu, J. R. Lloyd, Applied Physics Letters Materials ScienceNormal Grain GrowthElectrical EngineeringMaterial AnalysisEngineering	2004	74
Local Plasticity of Al Thin Films as Revealed by X-Ray Microdiffraction Ralph Spolenak, W. L. Brown, Nobumichi Tamura, Physical Review Letters Aluminium NitrideEngineeringSevere Plastic DeformationGrain SizeAl Thin Films	2003	60
Early stage of plastic deformation in thin films undergoing electromigration B. C. Valek, Nobumichi Tamura, Ralph Spolenak, Journal of Applied Physics EngineeringSevere Plastic DeformationSubgrain StructureMicrostructure-strength RelationshipElectronic Packaging	2003	59
Plastic deformation in Al (Cu) interconnects stressed by electromigration and studied by synchrotron polychromatic x-ray microdiffraction Kai Chen, Nobumichi Tamura, B. C. Valek, Journal of Applied Physics EngineeringSevere Plastic DeformationMechanical EngineeringMicrostructure-strength RelationshipElectronic Packaging	2008	48

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